Nova Measuring Instruments Ltd. providing metrology solutions for the semiconductor manufacturing industry. It offers in-line Optical and x-ray stand-alone metrology systems, as well as integrated optical metrology systems, which are attached directly to wafer fabrication process equipment. Read More Its products include set of in-situ, integrated and stand-alone metrology platforms suited for dimensional, films and material metrology measurements for process control across multiple semiconductor manufacturing process steps including lithography, Etch, CMP and deposition. The company was founded by Giora Dishon and Moshe Finarov in May 1993 and is headquartered in Ness-Ziona, Israel.